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Computed Tomography: Principles, Design, Artifacts, and Recent Advances, Second Edition (SPIE Press Monograph Vol. PM188), by Jiang Hsieh
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X-ray computed tomography (CT) continues to experience rapid growth, both in basic technology and new clinical applications. Seven years after its first edition, Computed Tomography: Principles, Design, Artifacts, and Recent Advancements, Second Edition, provides an overview of the evolution of CT, the mathematical and physical aspects of the technology, and the fundamentals of image reconstruction algorithms. Image display is examined from traditional methods used through the most recent advancements. Key performance indices, theories behind the measurement methodologies, and different measurement phantoms in image quality are discussed. The CT scanner is broken down into components to provide the reader with an understanding of their function, their latest advances, and their impact on the CT system. General descriptions and different categories of artifacts, their causes, and their corrections are considered at length.
Given the high visibility and public awareness of the impact of x-ray radiation, the second edition features a new chapter on x-ray dose and presents different dose reduction techniques ranging from patient handling, optimal data acquisition, image reconstruction, and post-process. Based on the advancements over the past five years, the second edition added new sections on cone beam reconstruction algorithms, nonconventional helical acquisition and reconstruction, new reconstruction approaches, and dual-energy CT. Finally, new to this edition is a set of problems for each chapter, providing opportunities to enhance reader comprehension and practice the application of covered material.
Contents:
- Preliminaries
- Image Reconstruction
- Image Presentation
- Key Performance Parameters of a CT Scanner
- Major Components of CT Scanner
- Image Artifacts: Appearances, Causes, and Corrections
- Computer Simulation and Analysis
- Helical or Spiral CT
- Multislice CT
- X-ray Dose and Reduction Techniques
- Advanced CT Applications
- Sales Rank: #2474986 in Books
- Published on: 2009-11-19
- Original language: English
- Number of items: 1
- Dimensions: 10.00" h x 7.50" w x 1.50" l, 2.90 pounds
- Binding: Hardcover
- 560 pages
About the Author
Jiang Hsieh, Ph.D., is the Chief Scientist at GE Healthcare and an adjunct professor in the Department of Medical Physics at University of Wisconsin-Madison. He has over 26 years of experience in medical imaging, holds over 160 U.S. patents, and has authored or co-authored more than 200 research articles, conference presentations, and book chapters. He taught short courses on x-ray computed tomography at SPIE Medical Imaging conferences, Radiology Society of North American annual meetings (RSNA), the IEEE Nuclear Science Symposium and Medical Imaging Conference, AAPM annual meetings, and AAPM summer school. His research interests include tomographic reconstruction, medical image processing, image artifact identification and correction, and advanced CT applications.
Most helpful customer reviews
2 of 2 people found the following review helpful.
Introduction to medical tomography (CT scanning)
By Ulfilas
I turned to this book for general information on tomography, as my actual interest is electron tomography in the transmission electron microscope (TEM). Within this 556 page, 12 chapter book is a useful introductory chapter on image reconstruction (Chapter 3, pp.55-117). Chapter 3 addresses such topics as the filtered backprojection algorithm, Radon and Fourier transforms, and digital computing considerations such as aliasing. The author uses equations as well as flow charts to help explain the calculation procedures and theory. It is also worth mentioning that this book also contains a chapter reviewing such mathematical concepts as Fourier transforms, convolution integrals, statistics, linear algebra, and x-ray Physics (Chapter 2, pp.23-53). The rest of the book is specific to CT scanning.
1 of 1 people found the following review helpful.
Looking for references in CT, buy this book first.
By indika walimuni
To be honest, I didn't buy this book from Amazon or any other seller for that matter as it was available to me through my school's library. I used this book as a basic reference and used it to find other more specific and technical references to my thesis works. I recommend this book to anybody specially those who have to study CT. However, it was organized in a simpler way so that anyone who has an interest can understand. It was to me like a mini encyclopedia of CT as this book bundled with many references that you might be looking for.
0 of 0 people found the following review helpful.
Long Unenlightening explanations
By NicNic8
The book lacks mathematical descriptions. He opts for long explanations that I did not find enlightening. I would not recommend this book; instead, I would opt for the text by Kak and Slaney. It's much more clear, and an electronic copy can be found free on the Internet.
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